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1 Panasonic Technical Journal Vol. 63 No. 1 May 2017 Development of Simultaneous-Capture Wide-dynamic-range Technology and Global Shutter Technology for Organic Photoconductive Film Image Sensor Masashi Murakami Masayuki Takase Kazuko Nishimura Yasuo Miyake Sanshiro Shishido Tokuhiko Tamaki db 10 We are trying to effectively offer greater value to customers and developing technology to dramatically enhance performance and functions utilizing the structural feature of organic photoconductive film (OPF) image sensors. In these sensors, the photoelectric conversion part and signal processing circuits are vertically stacked and they can be designed independently. We have proposed and developed a dual-sensitivity pixel utilizing this unique feature of the OPF CMOS image sensor. It realizes a simultaneous wide-dynamic-range image capture of over 120 db without time distortion. Photoelectric-conversion-controlled global shutter technology has also been developed by only modulating the voltage applied to OPF. It has improved the tradeoff performance and realized a high-saturation signal up to 10 times larger than the conventional image sensors. These technologies enable high-speed, high-precision imaging without time distortion in high-contrast scenes, and will be applied to new imaging and sensing devices. LED CMOSCMOS Image Sensor:CIS CCD CIS CCD [1]-[4] CCDCMOS 1120 db WDRWide Dynamic Range CMOS CIS CISPDPhoto Diode FD Floating Diffusion FD FD PD
2 35 PD CIS CMOS OPF FDFloating Diffusion FD [5]-[7] ITO Indium Tin Oxide μμ CMOS Conventional CMOS image sensor μ Organic photoconductive film image sensor CMOS Si PE1/PE2 1 1 _ 12 Dual-sensitivity pixel structure
![[6],[8] 4SF TrSEL Tr RST TrFB Tr2 CsCc Negative Feedback Gain-ARST Tr 1/(A Cc/Cfd)FB](/docs-images/74/69806199/images/3-1.jpg "Tr1/ (A Cs/Cc)ACs/Cc 5 μs25e-1.")
3 36 Panasonic Technical Journal Vol. 63 No. 1 May 2017 CS 10 CS10CIS 100 Si CCDCMOS FD RSTFD FD FBAMPFeed Back AMP FD FBAMP [6],[8] 4SF TrSEL Tr RST TrFB Tr2 CsCc Negative Feedback Gain-ARST Tr 1/(A Cc/Cfd)FB Tr1/ (A Cs/Cc)ACs/Cc 5 μs25e-1.6e- CcFD FB Tr CMOS Cross-sectional image of global shutter pixel ITOHigh FD ITO ITO Sensor operation timing
4 37 FD ITOHigh ITO 1 ITO 120 dbwdr 2 65 nm CMOS 126 μm6 μm μm3 μm Sub-LVDS 60 fps 6 μm6 μm ke- 5.7 e-1.6 e db Fabricated chip micrograph Chip characteristics +CMOS 65 nm CMOS 1P3Cu1Al μ k 50k, 210k LED LED LED LED 3 μm3 μm 1 FD
![1 May 2017 CIS [2] 10210ke- Image](/docs-images/74/69806199/images/5-1.jpg "captured with")
5 38 Panasonic Technical Journal Vol. 63 No. 1 May 2017 CIS [2] 10210ke- Image captured with photoelectric-conversion-controlled global shutter b Wide-dynamic-range captured image LED LED flicker-free dynamic-range captured image CMOS db 1 10 [1], CMOS,, vol.35, no.47, pp.1-8, [2] M. Sakakibara, et al., An 83dB-Dynamic-Range Single- Exposure GlCCobal Shutter CMOS Image Sensor with In-Pixel Dual Storage, ISSCC Dig. Tech. Papers, pp , Feb [3] B. Wolfs, et al., 3.5 μm Global Shutter Pixel with Transistor Sharing and Correlated Double Sampling, Proc. IISW, Utah, June 2013.
![39 [4] T. Kondo, et al.](/docs-images/74/69806199/images/6-0.jpg ", A 3D Stacked CMOS Image Sensor with 16Mpixel Global-Shutter Mode and")
![T22 T23, June 2013. [6] M. Ishii, et al.](/docs-images/74/69806199/images/6-3.jpg ", An Ultra-low Noise Photoconductive Film Image Sensor With a High-speed")
![Column Feedback, Dig. Symp. VLSI Circuits, pp. C8 C9, June 2013. [7] S.](/docs-images/74/69806199/images/6-4.jpg "Isono, et al., \"A 0.")
6 39 [4] T. Kondo, et al., A 3D Stacked CMOS Image Sensor with 16Mpixel Global-Shutter Mode and 2Mpixel 10000fps Mode Using 4 Million Interconnections, Dig. Symp. VLSI Circuits, pp. C90 C91, June [5] M. Mori, et al., Thin Organic Photoconductive Film Image Sensors with Extremely High Saturation of 8500 electrons/μm2, Dig. Symp. VLSI Circuits, pp. T22 T23, June [6] M. Ishii, et al., An Ultra-low Noise Photoconductive Film Image Sensor With a High-speed Column Feedback, Dig. Symp. VLSI Circuits, pp. C8 C9, June [7] S. Isono, et al., "A 0.9 µm pixel size image sensor realized by introducing organic photoconductive film into the BEOL process" Interconnect Technology Conference, pp , Jun [8] B. Pain et al., Reset Noise Suppression in Two-Dimensional CMOS Photodiode Pixels through Column-based Feedback-Reset, Dig. VLSI 2002 IEDM Tech. Dig., pp , Dec
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S/N S/N CCDCMOS CCD CMOS & E-mail hirofumi.sumi@jp.sony.com & E-mail Tadakuni.Narabu@jp.sony.com & E-mail Shinichiro.Saito@jp.sony.com Hirofumi SUMI, Non - Member and Tadakuni NARABU, Member and Shinichiro
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CMOS : swk(at)ic.is.tohoku.ac.jp [ 2003] [Wong1999] 2 : CCD CMOS 3 : CCD Q Q V 4 : CMOS V C 5 6 CMOS light input photon shot noise α quantum efficiency dark current dark current shot noise dt time integration
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swk(at)ic.is.tohoku.ac.jp 2 Outline 3 ? 4 S/N CCD 5 Q Q V 6 CMOS 1 7 1 2 N 1 2 N 8 CCD: CMOS: 9 : / 10 A-D A D C A D C A D C A D C A D C A D C ADC 11 A-D ADC ADC ADC ADC ADC ADC ADC ADC ADC A-D 12 ADC
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