Study on Application of the cos a Method to Neutron Stress Measurement Toshihiko SASAKI*3 and Yukio HIROSE Department of Materials Science and Enginee

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Study on Application of the cos a Method to Neutron Stress Measurement Toshihiko SASAKI*3 and Yukio HIROSE Department of Materials Science and Engineering, Kanazawa University, Kakuma-machi, Kanazawa-shi, Ishikawa, 920-1192 Japan In order to study on a method of neutron stress measurement using the simulation study was performed comparing with experimental data. The resultant diffraction profiles, which are defined as the distribution of the intensity of diffracted beams in the radial direction from the center of the diffraction ring, were calculated by summing all diffraction profiles which were diffracted at entire depth in the material. The locations of the peak points which were determined using the half value breadth method (or the centroid method) showed dent distribution with respect to the central angle of the diffraction ring even in case of stress free state. Though the method showed different values from the initial stresses, the difference between the calculated and initial stresses almost kept constant for different stress level. These misfit stresses can be vanished after correcting original diffraction radius using that in stress free. The results obtained by the present simulation study agreed with those obtained in the previous experiment, which suggests the validity of the method of neutron stress measurement combining both Key Words: Neutron, Stress Measurement, Image Plate, Diffraction, Penetration Depth

(a) Expression of a profile for individual neutron beam by means of Gaussian function (b) Superposition of each diffraction beam on area detector, and explanation on symbols used in the text Fig.1 Definition of coordinate system and other char acteristic parameters used in the text Fig.2 Schematic illustration on expression of a profile for individual neutron beam by means of Gaus sian function, and superposition of each diffraction beam on detector with symbols used in the text

Fig. 3 Strains used for stress calculation and other principal parameters used in the text

Fig. 5 Comparison of radius of diffraction ring obtained from experiment and simulation. Results of both half value breadth method and centroid method are shown Fig. 4 Comparison of diffraction profiles between experiment and simulation

(a) HVB method before correction (b) Centroid method before correction (c) HVB method after correction (d) Centroid method after correction Fig. 7 Distribution of radius of diffraction ring correct ed by the present method, and comparison of experiment and simulation Fig. 8 Radius of diffraction ring due to applied stress for before-correction and after-correction. Half value breadth method and centroid method are used for peak determination

(a) Diffraction profiles for individual beam (a) Resultant diffraction profiles on detector (b) Resultant diffraction profiles on detector (b) Diffraction profiles normalized (c) Radius of diffraction ring (c) Radius of diffraction ring

(6) Noyan, I. C. and Cohen, J. B., Residual Stress, Measure ment by Diffraction and Interpretation, (1987), 166, Springer-Verlag.