Keywords: hot carrier, submicron device, MOSFET, reliability, trap, interface states, lucky electron, electron temperature Hot Carrier Effects in MOS
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1 Keywords: hot carrier, submicron device, MOSFET, reliability, trap, interface states, lucky electron, electron temperature Hot Carrier Effects in MOS Devices. Mitsu masa KOYANAGI. Research Center for Inte grated Systems, Hiroshima University. Shitami, Saijo-cho, Higashi-Hiroshima 724.
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3 Photonics Technologies 3-1 Optical Modulators for Photonic Sideband Management KAWANISHI Tetsuya and IZUTSU Masayuki In this paper, we presented our recent works on development of optical modulators
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