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1 20 EBSD scanning electron microscope: SEM EBSD electron back scattering diffraction [1-4] 10 EBSD anisotropy polycrystal orientation texture EBSD EBSD EBSD EBSD Table 1 EBSD

2 Table 1-10 mmφ < ~60 min / pole figure [5,6] 1 < 1 mmφ < ~30 min / point [6] 5 < 10 µmφ < ~30 min / point [7-9] 0.5 < 5 µmφ < ~15 min / point [10,11] 0.5 < 5 µmφ < ~30 min / point [11-13] 0.1 < 10 nmφ < <0.02 s / point [1-4] < 10~15 1 µmφ < ~10 min / point [14] 0.1 < nmφ < ~5 min / point [15,16] X X [5,6] X 111 pole figure 111 X X orientation determination function: ODF [6] Figure 1 X ODF [17] ODF [6] X X

3 Fig.1 {111} ODF Al [17] Laue X X [18,19] {111}, {110}, {100} SEM [7-9, 20-22] Figure 2 Fe-19Cr Fe-36Ni SEM [23] BCC {110} 12 <111> FCC {111} {001} <110>

4 [23,24] Fe-19Cr SEM Fig.3 [25] {001} {111} 10 m Fig.2 Fe-19Cr Fe-36Ni SEM [23]

5 Fig.3 Fe-19Cr SEM [25] SEM scanning electron microscope EBSD X [10,11] Figure 4 [11] EBSD Kikuchi X Fig.4 X SEM

6 Fig.4 [11] SEM Fig.5 (a) [13] Fig.5 (b) Kikuchi ECP electron channeling pattern [11-13] Kikuchi m ECP ECP Fig.6 [26] Fe-19Cr 185 Fig.5 (a) ECP [13] (b) ECP

$SAD selected area diffraction Fig.$

7 Fig.6 ECP Fe-19Cr 185 TEM transmission electron microscope TEM SAD selected area diffraction Fig [001] [14] SAD EBSD

8 Fig.7 BCC [27]

9 EBSD EBSD SEM electron back-scattering pattern Kikuchi Kikuchi EBSD Fig.8 EBSD 1973 [1] EBSD Adams [28,29] Orientation Imaging Microscopy (OIM) [1] Fig.9 EBSD SEM microstructure grain boundary interface Kikuchi EBSD OIM Fig.8 Kikuchi SBSD

10 Fig.9 EBSD [3] EBSD Kikuchi 0.1 ECP Fig.6 EBSD EBSD

11 EBSD ECP Fig.10 ARB 4.8 EBSD 200nm 40 50nm Fig.10 ARB 4.8 Al EBSD (a) ND (b) RD (c) [30] EBSD Figure 11 EBSD [31,32] [31,32] EBSD EBSD Fig.11 [33]

$Fig.11 (a) 28.5at%Ni (b) 0.2wt%C EBSD [31,32] EBSD [33,34] 1 2 EBSD TEM Kikuchi TEM/Kikuchi EBSD [15] TEM/Kikuchi EBSD [1] Electron Backscatter Diffraction in Materials Science, Edited by A.J.$

12 Fig.11 (a) 28.5at%Ni (b) 0.2wt%C EBSD [31,32] EBSD [33,34] 1 2 EBSD TEM Kikuchi TEM/Kikuchi EBSD [15] TEM/Kikuchi EBSD [1] Electron Backscatter Diffraction in Materials Science, Edited by A.J.Schwartz, M.Kumar and B.L.Adams, Kluwer Academic / Plenum Publishers, New York, (2000). [2] Microtexture Determination and its applications, V.Randle, The Institute of Materials, London, (1992) [3], 50 (2000), 86. [4], 40 (2001), 612. [5] (1984) [6] X (1977) [7], 18 (1979), 282.

13 [8] 18 (1979), 642. [9], 20 (1981), 377. [10], 18 (1979), 632. [11], 33 (1983), 491. [12], 13 (1974), 177. [13], 42 (1992), 306. [14] E.Furubayashi: Scripta Metall. Mater., 27 (1992), [15] S.Zaefferer: J. Appl. Cryst., 33 (2000), 10. [16], 57 (1993), 726. [17] N.Tsuji, Y.Nagai, T.Sakai and Y.Saito: Mater. Trans. JIM, 39 (1998), 252. [18] D.Juul Jensen, E.M.Lauridsen, L.Margulies, H.F.Poulsen, S.Schmidt, H.O.Sørensen and G.B.M.Vaughan: Materials Today, 9 (2006), 18. [19], 48 (2008), 301. [20] G.E.G.Tucker and P.C.Murphy: J. Inst. Metals, 8 ( ), 235. [21], 22 (1958), 320. [22], 22 (1958), 324. [23] (1994) [24] (1992) [25] N.Tsuji, K.Tsuzaki and T.Maki: ISIJ International, 32 (1992), [26] N.Tsuji, K.Tsuzaki and T.Maki: ISIJ International, 33 (1993), 783. [27] (2001) [28] B.L.Adams: Mater. Sci. Eng., A166 (1993), 59. [29] B.L.Adams, S.I.Wright and K.Kunze: Metall. Trans. A, 24A (1993), 819. [30] (2005) [31] H.Kitahara, R.Ueji, M.Ueda, N.Tsuji and Y.Minamino: Mater. Characterization, 54 (2005), 378. [32] H.Kitahara, R.Ueji, N.Tsuji and Y.Minamino: Acta Mater., 54, (2006), [33] A.F.Gourgues-Lorenzon: Int. Mater. Rev., 52 (2007), 65. [34] X.Huang, N.Tsuji, N.Hansen and Y.Minamino : Mater. Sci. Eng. A340 (2003), 265. [35] N.Kamikawa, N.Tsuji, X.Huang and N.Hansen: Acta Mater., 54, (2006), 3055.

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untitled (a) (b) (c) (d) (e) (f) (g) (f) (a), (b) 1 He Gleiter 1) 5-25 nm 1/2 Hall-Petch 10 nm Hall-Petch 2) 3) 4) 2 mm 5000% 5) 1(e) 20 µm Pd, Zr 1(f) Fe 6) 10 nm 2 8) Al-- 1,500 MPa 9) 2 Fe 73.5 Si 13.5 B 9 Nb