IPSJ-CVIM
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- あゆみ しどり
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1 IPSJ SIG Technical Reprt Vl.2011-CVIM BRDF Estimatin Cnsidering Scatterings f Illuminatin and Reflectin Yk Baba, 1 Yasuhir Mukaigawa 1 and Yasushi Yagi 1 The bserved reflectance features change, if they are put in scattering media. This phenmenn is caused by scattering f illuminated and reflected lights. The incident light frm the light surce scatters befre it reaches at the surface f the bject. Similarly, the reflected light scatters befre it reaches at the camera. In this paper, we prpse a new reflectance mdel which can express the interactin between the transmittance feature f the media and the reflectance feature f the bject by taking the scattering f illuminated and reflected lights int accunt. Based n the reflectance mdel, the transmittance feature in the scattering media and the reflectance feature f the bject are sequencially estimated by tw steps using a reference bject whse reflectance feature is knwn. We examined the validity f the prpsed mdel by the simulatin experiment. We als examined the accuracy f the estimatin f the reflectance feature which takes int accunt the scattering in the media. 1. CG 1) 2) ) ) 5) 6) 7)8) 2. 1(a)(b) ( ) (b) (a) 1 Institute f Scientific and Industrial Research, Osaka University 1 c 2011 Infrmatin Prcessing Sciety f Japan
2 IPSJ SIG Technical Reprt Vl.2011-CVIM (a) (b) 1 散乱媒体 対象物体 散乱媒体物体 (a) (b) 2 (b) 2(a) 2(b)..1.2 (BRDF:Bi-directinal Reflectance Distributin Functin) BRDF (a) I= (θ i, φ i ) R= (θ r, φ r ) (BTDF:Bi-directinal Transmittance Distributin Functin) BTDF (b) I= (θ i, φ i ) T = (θ t, φ t ) f r(i,r)f t(i,t ) IRT 2 c 2011 Infrmatin Prcessing Sciety f Japan
3 IPSJ SIG Technical Reprt Vl.2011-CVIM L θ i θ r φ i V φ r L φ i θ i φ t θ t V 5 (a) BRDF (b) BTDF (I ) (R ) f(i, R) f(i, R) = f t (I, I )f r (I, R )f t (R, R)dI dr (1) Ω + Ω + Ω +. (CG) CG (CV) CG CV..1 Phng Beckmann Ck-Trrance Trrance-Sparrw 9) 5 ρ d ρ s n η ρ d ρ s P d P s..2 CG 10) 11) 6 7 γ g 1 2 c 2011 Infrmatin Prcessing Sciety f Japan
4 IPSJ SIG Technical Reprt Vl.2011-CVIM 既知 BRDF R 計測 1 BRDF R BTDF 推定 BTDF 推定 BRDF T 計測 2 BRDF T BTDF γ P d P s n η b T d T t g η u f t(i, T ) = τ d + τ tp(g, γ)f t(θ i, θ i2)f t(θ i2, θ i), (2) p(g, γ) = 1 1 g 2, () π (1 + g 2 2gcsγ) 2 { } F t (θ i, θ i2 ) = 1 1 sin 2 (θ i θ i2) 2 sin 2 (θ i + θ + tan2 (θ i θ i2). () i2) tan 2 (θ i + θ i2) (2) 1 2 τ d τ t F t (θ i, θ i2 ) F t(θ i2, θ i) θ i2θ i τ d τ t T d T t 1.1 (1).2 () () 2 (1) Levenberg-Marquardt (1) c 2011 Infrmatin Prcessing Sciety f Japan
5 IPSJ SIG Technical Reprt Vl.2011-CVIM P d P s n η BRDF BRDF T d T t g η BTDF BTDF BTDF (a) BRDF1 (b) BRDF2 9 8 BRDF R BRDF T BT DF (a) BTDF1 (b) BTDF2 (c) BTDF BRDF R BT DF 10 BRDF T BT DF 5..0x10 BRDF1 BRDF1*BTDF1 BRDF1*BTDF2 BRDF1*BTDF.0x10 BRDF2 BRDF2*BTDF1 BRDF2*BTDF2 BRDF2*BTDF BRDF1BRDF2 BRDF1 BRDF2 2 BRDF1BRDF2 5 9 BTDF1BTDF2BTDF BTDF1 BTDF BTDF2 BTDF1 BTDF (a) BRDF1 11 θr (b) BRDF2 10 g BRDF1BRDF g BRDF1BRDF2 CG 12(a),(e) θr 90 5 c 2011 Infrmatin Prcessing Sciety f Japan
6 Vl.2011-CVIM 情報処理学会研究報告 IPSJ SIG Technical Reprt 散乱媒体 物体 回転ステージ (a) BRDF1 (b) BRDF1 BTDF1 (c) BRDF1 BTDF2 ピンホール 光源 (d) BRDF1 BTDF カメラ (a) 光源 カメラ 物体の位置関係 (b) 計測システム 図 1 計測環境 (e) BRDF2 図 12 (f) BRDF2 BTDF1 (g) BRDF2 BTDF2 (h) BRDF2 BTDF 常に一定となるように 図 1(b) に示す円筒の中心にアクリル板を設置し 円筒内部を散乱 散乱媒体の影響を受けた見かけの反射特性に基づくレンダリング 媒体で満たした このような配置にすることで 大気と散乱媒体の境界での光の通過が常に 垂直となり 屈折の影響を無視できる 図 1 のように 光源 (MORITEX 製のハロゲンライト MHF-M1001) とカメラ (ikn D90) と観測点が同一平面上に乗るように配置した 点光源を作るため光源の前にピンホー ルを設置した 入射角と反射角を変化させながら反射光の強度を計測するために 光源とカ メラを固定した状態で 回転ステージを使って円筒を回し 反射光を計測した 計測時間を (a) 物体 (b) 計測のための容器 減らすために 鏡面反射が強く観測される正反射領域付近は密に それ以外の領域は粗く計 測した この計測を光源とカメラの相対角度を と変えて行った 図 1 計測対象 参照物体の反射特性の計測とモデル化 参照物体である白色アクリル板の反射特性を求め モデル化する 参照物体単体の反射特 BRDF1 BRDF2 の周囲に各媒体が存在する場合の見かけの反射特性に基づいてレンダリ 性を求めるため 散乱媒体の代わりに水を円筒の内部に満たして計測した ングした CG を図 12(b) (d) (f) (h) に示す 散乱媒体によって見かけの反射特性が変化 していることがわかる また散乱媒体ごとに鏡面反射の明るさや広がりが異なることがわ 図 15(a) のグラフ中の点は 各反射角 θr における計測値を 光源とカメラの相対角ごと かる 特に散乱の大きい BTDF では鏡面反射の広がりとピーク値の減少が顕著に確認で に示したものである この計測結果を反射モデルに当てはめた結果を図 15(a) の実線に示 きる す 推定されたパラメータは Pd = Ps = n = 0.80 ηb = 1.16 と 5.2 対象物体の反射特性推定 なった 図 15(a) の結果より概ね良好な推定ができていると言える この反射特性を用いて 実 験 環 境 レンダリングした CG の例を図 15(b) に 入射角が 5 の場合の反射光の空間的な広がり.2 節で述べた手法を用いて 実際に散乱媒体内の物体の真の反射特性を推定する実験を を図 15(c) に示す 5.2. 散乱媒体の透過特性の推定 行った 参照物体として図 1(a) の上に示す白色アクリル板を 対象物体として図 1(a) の 下に示す赤い塩化ビニル板を用いた また散乱媒体として水で薄めた乳酸飲料を用いた 光 次に 散乱媒体の透過特性を推定する そのために前節で反射特性を計測した白色アクリ 源と物体 およびカメラと物体の間に存在する散乱媒体の厚みが入射 反射方向に依存せず ル板を散乱媒体に入れ その見かけの反射特性を計測した この計測結果と前節で求めた反 Infrmatin Prcessing Sciety f Japan
7 IPSJ SIG Technical Reprt Vl.2011-CVIM x10 Relative angle 0 Relative angle 60 Relative angle x10.0x10 Relative angle 0 Relative angle 60 Relative angle 90.0x10 5.0x10 (b) CG 0 θ r (a) 1.5x10 5.0x10 15 Relative angle 0 Relative angle 60 Relative angle 90 0 θ r (a) 16 5 (c) 5 5 (b) (1) 0 θ r (a) θ r (1) θ r 60 T d = T t = g = 0.99 η u = (c) 5.2. (1) P d = P s = n = 0.20η b = θ r P d = P s = n = 0.8η = c 2011 Infrmatin Prcessing Sciety f Japan
8 IPSJ SIG Technical Reprt Vl.2011-CVIM x10 Relative angle 0 Relative angle x10 Relative angle 90 Grund truth 5 2 Estimated mdel 5 0 θ r (a) (b) (a) 5 (b) 6. 1) G. J. Ward, Measuring and mdeling anistrpic reflectin, Prc. SIG- GRAPH 92, pp , ) Y. Mukaigawa, K. Sumin, and Y. Yagi, Rapid BRDF Measurement using an Ellipsidal Mirrr and a Prjectr, IPSJ Transactins n Cmputer Visin and Applicatins, Vl.1, pp.21-2, ) -, D, Vl.J92-D,.9, pp , ), Rbby T. Tan,,,, (MIRU2009), ) S. K. ayar, G. Krishnan, M. D. Grssberg, and R. Raskar, Fast Separatin f Direct and Glbal Cmpnents f a Scene using High Frequency Illuminatin, Prc. SIGGRAPH2006, pp.95-9, ),,,,,, CVIM 17-11, ) S. G. arasimhan and S. K. ayar, Shedding light n the weather, Prc. IEEE CVPR200, vl. 151, pp , 200 8) S. G. arasimhan, M. Gupta, C. Dnner, R. Ramamrthi, S. K. ayar, and H. W. Jensen, Acquiring scattering prperties f participating media by dilutin, Prc. SIGGRAPH2006, pp , ) K. E. Trrance and E. M. Sparrw, Thery fr Off-Specular Reflectin Frm Rughened Surfaces, JOSA, Vl. 57, Issue 9, pp , ) J. F. Blinn, Light reflectin functins fr simulatin f cluds and dusty surfaces, Cmputer Graphics, Vl.16, Issue, pp.21-29, ) J. Gu, R. Ramamrthi, P.. Belhumeur, and S.K. ayar, Dirty Glass: Rendering Cntaminatin n Transparent Surfaces, Prceedings f Eurgraphics Sympsium n Rendering, c 2011 Infrmatin Prcessing Sciety f Japan
(a) 1 (b) 3. Gilbert Pernicka[2] Treibitz Schechner[3] Narasimhan [4] Kim [5] Nayar [6] [7][8][9] 2. X X X [10] [11] L L t L s L = L t + L s
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1,a) 1,b) 1,c) 1,d) 1. CG 1 1 630 0192 8916 5 a) kushida.takahiro.kh3@is.naist.jp b) funatomi@is.naist.jp c) hkubo@is.naist.jp d) mukaigawa@is.naist.jp 散乱なし 散乱あり 1 2. c 2017 Information Processing Society
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