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1 Tipsnano 社製 FM/SPM プローブカタログ ゴールデンプローブ CSG, NSG シリーズ ゴールデンプローブ CSG11 のみ ETLON プローブ H シリーズ TOP VISUL プローブ Whisker プローブ CSC, NSC シリーズ PH プローブ スーパーシャーププローブ DLC スーパーシャーププローブ単結晶シリコン ダイヤモンドコートプローブ DCP シリーズ ダイヤモンドコートプローブ H_DCP シリーズ 単結晶ダイヤモンドプローブ DEP シリーズ 単結晶ダイヤモンドプローブ DRP30 単結晶ダイヤモンドプローブ DRP, DRPS シリーズ 単結晶フルダイヤモンドプローブ FD シリーズ コロイダルプローブ CP シリーズ ティップレスプローブ Tipless シリーズ
2 スタンダードプローブ ゴールデンプローブ カンチレバーティップ曲率半径反射共振周波数, khz 力定数, N/m カンチレバーカンチレバーカンチレバー可能な導電性ティップコート Typical 保証値コート min typical max min typical max 長, 幅, 厚, u PtIr Pt TiN W2C CSG ± ± ± 0.5 〇 〇 - 〇 CSG ± ± ± 0.75 〇 〇 - - CSG ± ± 7 2 ± 1 - 〇 - - FMG ± ± ± 0.5 〇〇 u NSG ± ± ± 0.75 〇〇 - - NSG ± ± ± 1.0 〇 〇 - - NSG ± ± ± 1.0 〇 〇 - 〇 NSG ± ± ± 〇 - - CSG ± 5 35 ± 3 1 ± 0.5 ~ 10 - u B ± 5 35 ± 3 1 ± ETLONプローブ カンチレバー 反射共振周波数, khz 力定数, N/m カンチレバーカンチレバーカンチレバー可能な導電性ティップコート Typical 保証値コート min typical max min typical max 長, 幅, 厚, u PtIr Pt TiN W2C H_C ± 2 34 ± ± 0.15 B ± 2 34 ± ± 0.15 H_CNC ± 2 34 ± ± 0.15 B ± 2 34 ± ± 〇 - H_FM ± 2 34 ± 3 3 ± 0.15 u B ± 2 34 ± 3 3 ± 0.15 H_NC ± 2 34 ± ± 0.15 B ± 2 34 ± ± 0.15 H_HR ± 2 34 ± 3 3 ± 0.15 B ± 2 34 ± 3 3 ± 0.15 TOP VISULプローブ 反射共振周波数, khz 力定数, N/m カンチレバーカンチレバーカンチレバー可能な導電性ティップコート Typical 保証値コート min typical max min typical max 長, 幅, 厚, u PtIr Pt TiN W2C VIT_P_C ± ± ± VIT_P/IR 6 10 l ± ± 5 5 ± 1 〇 - 〇 - VIT_P ± ± 5 5 ± 0.5 〇 - 〇 - 磁気プローブカンチレバー 反射共振周波数, khz 力定数, N/m カンチレバーカンチレバーカンチレバー磁気ティップ Typical 保証値コート min typical max min typical max 長, 幅, 厚, コート MFM_LM ~ ± ± ± 1 CoCr l MFM01 ~ ± 5 28 ± 5 3 ± 0.5 CoCr ± 2 34 ± 3 3 ± 0.15 H_FM/HC 65 - CoCr B ± 2 34 ± 3 3 ± 0.15 u ± 2 34 ± 3 3 ± 0.15 H_FM/CoFe < 35 - CoFe B ± 2 34 ± 3 3 ± 0.15 東京都江東区木場 TEL: /FX:
3 高アスペクト比プローブ Whiskerプローブ 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, コート Whisker 長, μm 傾斜角度 CSC05_ ± ± 5 1 ± ± CSC05_ ± ± 5 1 ± ± u NSC05_ ± ± 5 2 ± ± NSC05_ ± ± 5 2 ± ± PHプローブ カンチレ反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, バーコート PH_NC 5-8 < ± 2 34 ± ± 0.15 u B 5-8 < ± 2 34 ± ± 0.15 ティップ全長, μm 8 スーパーシャーププローブ 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, コート ティップ材質 NSG01_DLC u ± 5 35 ± 3 2 ± 0.5 DLC CSG10_SS ± ± 5 1 ± 0.5 FMG01_SS 2 5 l ± ± ± 0.5 単結晶シリコン NSG30_SS ± ± ± 1 ダイヤモンドコートプローブ カンチレ反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, バーコート ダイヤモンドコーティング DCP10 ~ ± 5 35 ± 3 2 ± 0.5 導電性あり : DCP20 ~ ± 5 60 ± 3 2 ± 0.5 diamond doped by nitrogen, film resistivity: 0,5-1 Ohm*cm H_C_DCP ± 2 34 ± ± 0.15 ~ B u ± 2 34 ± ± 0.15 H_FM_DCP ± 2 34 ± ± 0.15 Highly doped diamond, ~ B ± 2 34 ± ± 0.15 doping level: ppm B H_HR_DCP ± 2 34 ± ± 0.15 ~ B ± 2 34 ± ± 0.15 東京都江東区木場 TEL: /FX:
4 単結晶ダイヤモンドプローブ 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, Typical 保証値コート min typical max min typical max DEP01 7 < ± ± ± 0.5 DEP30 7 < ± ± 5 3 ± 0.5 DRP30_SS 2 < ± ± 5 3 ± 1.0 DRPS_In_C 10 < 15 u ± ± 5 4 ± 0.5 DRP_In_C 25 < ± ± 5 4 ± 0.5 DRPS_In 10 < ± ± 5 4 ± 0.5 DRP_In 25 < ± ± 5 4 ± 0.5 _Cモデル : 校正データ付属 単結晶フルダイヤモンドプローブ 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, Typical 保証値コート min typical max min typical max H_C/FD ± 2 34 ± ± 0.15 u H_NC/FD ± 2 34 ± ± 0.15 ティップ高 300 ± ± ± ± ± ± ± 100 ½ 円錐角 15 ± 2 15 ± 2 15 ± コロイダルプローブ 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, SiO2 sphereサイズ (typical) Typical 保証値コート min typical max min typical max B C D E CPC ± ± ± 1 CPFM - - なし ± ± ± CPN ± ± ± 1 ティップレスプローブ カンチレバー 反射共振周波数, khz 力定数, N/m カンチレバー長, カンチレバー幅, カンチレバー厚, Typical 保証値コート min typical max min typical max H_C/tipless ± 2 34 ± ± B ± 2 34 ± ± 0.15 H_NC/tipless - - u ± 2 34 ± ± 0.15 B ± 2 34 ± ± 0.15 NSG11/tipless ± 5 35 ± 3 2 ± B ± 5 35 ± 3 2 ± 0.5 東京都江東区木場 TEL: /FX:
5 Tipsnano 社製 / テストサンプル 1 step - SiO2, bottom Si Period 3 ± 0.05 Period 3 ± ,0 ± 1.5 * 110 ± 2 * TGZ4 Period 3 ± 0.05 Period 3 ± ± 3 * 1517 ± 20 * TGQ1 3-Dimensional array of rectangulars Period 3 ± 0.05 Rectangles side size 20 ± 1.5 * 1.5 ± 0.35 the grating is formed on Si wafer top surface 3-D array of sharp tips Period 3 ± central square 2 x 2 mm Tip angle 50 ± 10 degrees (on the very tip end) Tip curvature radius 10 Diagonal period 2.12
6 Tipsnano 社製 / テストサンプル 2 Si Period 3 ± D array of triangular steps (in X or Y direction) having precise linear and angular sizes TGX1 Si chessboard-like array of square pillars with sharp undercut edges Period 3 ± 0.05 ~ 0.6 Edge angle Edge radius 70 degrees 10 Edge curvature radius less then 10 TDG01 Period the grating is formed on the chalcogenide glass coated by l parallel ridges in X or Y direction, 1-Dimensional 278 ± 1 テストサンプル PFM03 Sample size Sample thickness, h 5 x 5 mm 500 Period, D 10 Dash length, L 100 > 55 diameter 12.5 mm, thickness - 2,5 mm central diameter 9 mm Fixed on a metal substrate by conductive epoxy. Lithium niobate (LiNbO 3 ) single-crystalline 500-μm-thick plate with roughness less than 10 cut normal to the polar axis. テストサンプル DN01 DN01 is Plasmid pgem7zf+ (Promega) which is linearized with the SmaI endonuclease. linear DN molecules (3000 b. p.) are deposited onto freshly cleaved mica. Molecules are uniformly distributed on the surface with molecule density - 0,5-7 molec./um2 and typical DN length Recommended humidity for obtaining a good image is 3-5% テストサンプル SiC/0.75, SiC/1.5 verage interstep distance Misorientation of surface Single step height verage roughness of the area between steps (terraces) 5 x 5 x 3 mm (SiC/0.75) (SiC/1.5) ~ 0.2 (SiC/0.75) ~ 0.3 (SiC/1.5) 0.75 (SiC/0.75) 1.5 (SiC/1.5) 0.09
7 Tipsnano 社製 / テストサンプル 3 セット TGS1 セット TGS2 TGX1 セット TGSFull セット TGS_Cer TGQ1 TGQ1 TGX1 TDG01 校正証明書付き TDG01 セット TGS1_PTB セット TGS1F PTB Traceable certificate 付き TGZ4
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