1-x x

µ (+) +z µ ( ) Co 2p 3d µ = µ (+) µ ( ) W. Grange et al., PRB 58, 6298 (1998).

1.0 0.5 0.0 2 1 XMCD 0-1 -2-3x10-3 7.1 7.2 7.7 7.8 8.3 8.4

up E down ρ + (E) ρ (E) H, M µ f + f E F f + f f + f X L 3 2p 3/2 X µ ρ + (E) ρ (E) L 2 2p 1/2 K 1s L 3 XMCD ( Sum rule )

3d K (1s 4p)... 4p Cr, Mn, Fe, Co, Ni, Cu... L2,3 (2p 5d)... 5d Nd, Sm, Eu, Gd, Dy, Er, Ce... L2,3 (2p 5d)... 5d Pt, Au, Ir... X MCD

BL25SU Fe, Co, Ni 3d Nd, Sm, Gd 4f Ru, Rh, Pd 4d Nd, Sm, Gd 5d BL39XU Fe, Co, Ni 4p Pt, Au 5d 100 2 3 4 5 6 7 8 9 1000 2 3 4 5 6 7 8 9 10000 Photon energy (ev) 2 3

SPring-8 BL39XU SPring-8 BL39XU SPring-8 X X: 5~37 kev (2.5~0.3Å) : 0.6() x 0.6() mm : 10 13 photons/ : 90% Si C 111 () X : 45º X H µ~10-4 X

10 4 10 2 1 S (ω) 1 Hz 1/f H I 0 I + I S (ω ω 0 ) 1 khz 1 MHz N(ω) XMCD,!µt (x10-3 ) XAS, µt (arb. unit) 4 2 0-2 -4 2.5 2.0 1.5 1.0 0.5 0.0 7090 (a) Fe (b) Fe foil 5 µm thickness 7100 7110 7120 x-ray energy (ev) XMCD XMCD ~10-5 10., helicity modulation, helicity reversal 20 XMCD (x10-4 ) 7130 7140 7150 M. Suzuki et al., Jpn. J. Appl. Phys. 37, L1488 (1998). 1.0 0.5 0.0 (c) -0.5 7090 7095 7100 7105 x-ray energy (ev)

electromagnet I ion chamber I 0 ion chamber x-rays sample P < 50 GPa 47 mm He : 0 ~ 2 T : 20 ~ 300 K : 0 ~ 10 T : 1.7 ~ 300 K Tiny DAC (23.8 m φ23.8 mm N. Ishimatsu et al., SRMS 2006, Chicago.

Ms Mr Hk Hc TC TSR

T < TSR

P42/nmn M M L J = L S S S Nd 5d Nd 4f Fe 3d Fe 3d Nd 4f Nd 4f X MCD... Nd 4f, Fe 3d Fe (6) Nd (2) B X MCD... Nd 5d, Fe 4p

XMCD x 100 (a. u.) X MCD... Nd 5d, Fe 4p 4f 0 4f 3 4f 11 4f 14 J. Chaboy et al., PRB 54, R15637 (1996) J. Miguel-Soriano et al., JAP 87, 5884 (2000).

XMCD x 100 (a. u.) X MCD... Nd 5d, Fe 4p 4f 0 4f 3 4f 11 4f 14 J. Chaboy et al., PRB 54, R15637 (1996) J. Miguel-Soriano et al., JAP 87, 5884 (2000).

XMCD x 100 (a. u.) X MCD... Nd 5d, Fe 4p 4f 0 4f 3 4f 11 4f 14 La Ce Pr Nd Sm Gd Tb Dy Ho Er Tm Yb Lu 4f gj (µb) 10 5 0 5 Fe K XMCD (4p) 4f Fe K XMCD (arb. unit) J. Chaboy et al., PRB 54, R15637 (1996) J. Miguel-Soriano et al., JAP 87, 5884 (2000).

TSR = 135 K [001] [110] M θ Nd2Fe14B M X +H X J. Chaboy et al., PRB 57, 8424 (1998).

TSR = 135 K TSR = 135 K T = 4 K Nd: θ = 58º Fe: θ = 27º T < TSR Nd Fe J. Chaboy et al., PRB 57, 8424 (1998). X MCD: L. M. Garcia et al., JAP 87, 6567 (2000).

Nd (g) Nd (f) P42/nmn X [110] (110), (220) I +, I H // [001] Nd2Fe14B (I + I )/(I + + I ) Nd L2 (6.72 kev) (110)... Nd g (220)... Nd f (440)... Nd g + f D. Haskel et al., PRL 95, 217207 (2005).

(110)... Nd g (220)... Nd f X [110] H // [001] (110), (220) I +, I Nd2Fe14B (I + I )/(I + + I ) Nd L2 (6.72 kev) XMCD + D. Haskel et al., PRL 95, 217207 (2005).

Nd (g) Nd (f) P42/nmn (I + I )/(I + + I ) (110) (220) g f D. Haskel et al., PRL 95, 217207 (2005).

Hc

XY+ X KB X + XMCD (180x140 µm) 47.30 47.15 BL39XU, SPring-8 X: 6 16 kev : 3d,, 5d µm 47 X 35 FE ( ) 29 0 (m)

SPring-8 BL39XU X (SDD) H X X 8 koe magnet's poles pinhole! XY XMCD sample magnetic field circular polarized micro-x-ray beam M. Suzuki, M. Takagaki, Y. Kondo, et al., Proceedings of SRI2006, AIP Conference Proceedings Vol. 879, 1699 (2007).

XMCD X-ray intensity (arb. unit) 1.0 0.5 0.0 1.0 0.5 X : 11.1 kev FWHM 0.75 µm FWHM 1.3 µm Position (µm) 35 30 25 20 15 10 0 0 10 20 30 40 50 60 5 2.4 4.8 4.8 10 Position (µm) 10 µm : CoCrPtB 5.0 0.0-5.0 XMCD [x10-2 ] (relative to XAS) ( 0.0-5 0 5 position (µm) ) : 0.75(H)x1.3(V) µm : 4x10 10 photons/s M. Takagaki, M. Suzuki, N. Kawamura, H. Mimura, T. Ishikawa IPAP Conference Series 7, 267 (2006).

: Tb 3 Fe 5 O 12 () : Fe/Gd X-ray energy: 7.11 kev (Fe K) 120 position (µm) 30 20 10 position (µm) 100 80 60 40 20 0 0 0 20 40 60 80 position (µm) 120 100 0 40 80 position (µm) 120 position (µm) 30 20 10 position (µm) 80 60 40 0 20 0 20 40 60 position (µm) 80 0 0 40 80 120

パターン媒体 FIB加工磁気ドット Co80Pt20(15 nm)/au(6 nm)/ti(5 nm) 0.15 Gaイオン (30 kv, 1 pa) によるパターニング Pt XMCD amplitude (arb. unit) 連続膜 (未加工の領域) X線ビームスポット ~ø 2 µm 8 µm 面直磁場 ドット加工領域 0.10 0.05 0.00-0.05 continuous film (θ = 0 ) dots (θ = 0 ) -0.10-0.15-4000 -2000 0 2000 external field (Oe) 1 µm ドットサイズ:100x100 nm ドット間隔100 nm ドット領域では 連続膜と比べて 保磁力が増大 (200 1600 Oe) 残留磁化比が増大 (M0/Ms = 0.1 0.7) M. Suzuki, M. Takagaki, Y. Kondo, et al., Proceedings of SRI2006, AIP Conference Proceedings 879, 1699 (2007). 4000

XMCD 1. (Hc) 2. µm (,, ) 3.

(PEEM) a) hν = 5.997 kev b) hν = 6.009 kev c) hν = 7.131 kev (Cr K edge) (Cr K edge) (Fe K edge) b) (Chromite) (Daubreelite) a) M. Kotsugi et al., Surf. Sci. 601, 4764 (2007).

Widmanstatten structure SEM 5mm γ α α-feni γ 46 γ SR γ α α 5µm 5μm M. Kotsugi et al., submitted.

NdFeBPEEM FE-SEM XAS Nd M4 XAS Fe L3 XMCD Fe L3 XMCD Fe L3 () SPring-8 BL25SU S. Yamamoto et al., Mater. Trans. 49, 2354 (2008).

5d