22 Na 22 Na + 22 Ne 2. 陽電子寿命測定 (PAL) の技術的背景図 2 Na 2. 1 陽電子寿命測定法の原理 2) 3)-6) X 7) 8) 図陽電子寿命 ( 陽電子自由消滅 ) N I I -dn/dt N /NdN - dt lnn - t C

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1 技術資料サブナノナノ空孔評価のための陽電子寿命測定技術の現状と課題 * Current Issues on Positron Annihilation Lifetime Techniques for Subnano- and Nano-scale Hole Evaluation. Masato YAMAWAKI Abstract Recently, positron annihilation lifetime spectroscopy (PALS) has received much attention as a high sensitive and analytical technique to evaluate subnano- and nano-scale hole within materials. In this paper the current state and technical background of the PALS application in industrial fields are overvewed. Technical issues and strategies to promote further development of the PALS application and the solutions are discussed. 1. はじめに 1) kev RI X MeV RI + p n e + RI 図 1 Vol., No.

1 陽電子寿命 ( 陽電子自由消滅 ) N I I -dn/dt N /NdN - dt lnn - t C N e -λt 0 e

2 22 Na 22 Na + 22 Ne 2. 陽電子寿命測定 (PAL) の技術的背景図 2 Na 2. 1 陽電子寿命測定法の原理 2) 3)-6) X 7) 8) 図陽電子寿命 ( 陽電子自由消滅 ) N I I -dn/dt N /NdN - dt lnn - t C N e -λt 0 e -λτ /e N(t) N 0 e - t /τ0 t 0 / ポジトロニウムの寿命 Ps: positronium Ps AIST Bulletin of Metrology Vol., No. September

p-ps ps o-ps ns o-ps p-ps o-ps o-ps ns o-ps p-ps e + o-ps p-ps o-ps o-ps 3 ns R nm 3

3 3 / [ R/R 0 /sin R/R 0 ] -1 R 0 R + 図 4 Ps Ps Ps o-ps p-ps p-ps X 00 / 1/2 [α e π - e α π ] o-ps X 01 / 1/2 [α e p + e α p ] X 11 α e α p S L X 1-1 e p S L p-ps o-ps Ps p-ps ps o-ps ns o-ps p-ps o-ps o-ps ns o-ps p-ps e + o-ps p-ps o-ps o-ps 3 ns R nm 3 nm nm 3 =[ / / pick-off {R /R }] -1 o-ps p-ps o-ps o-ps 3 図 5 o-ps 図 6 Vol., No.

4 陽電子寿命の解析 y(t) Δt y(t)δt N FWHM FWHM t 0 y(t)δt N t 0 PATFIT 12) PATFIT t = kev ns BaF 2 MeV kev CFD Constant Fraction Discriminator MeV kev TAC Time-to-Amplitude Converter MCA Multi Channel Analyzer 2. 2 陽電子寿命測定装置の構成 22 Na 22 Na 22 Ne MeV 図 7 図 8 AIST Bulletin of Metrology Vol., No. September

2. 2. 1 陽電子線源の作製とサンプルセッティング MBq GBq mm µm 22 Na 22 Na MBq mm mm 13) 22 Na E max MeV

5 陽電子線源の作製とサンプルセッティング MBq GBq mm µm 22 Na 22 Na MBq mm mm 13) 22 Na E max MeV Bethe N(x)/N 0 exp( µx) µ[m 2 /kg] (E max ) N(x)/N 0 x kg/m 2 µ m 2 /kg E max MeV E max 22 Na mm mm 22 Na mm デジタルオシロスコープ (DSO: Digital Storage Oscilloscope) を用いた陽電子寿命測定法 DSO 14) ps DSO ps DSO CFD TAC / ps / 図 9 図 10 Start/Stop Vol., No.

図 11 2. 2. 3 シンチレータ BaF 2 ns ZnO: Ga 15) n /n 0.5 LaBr 3 :Ce LaCl 3 :Ce LuI 3 :Ce 16),17) ns BaF 2 Z Z 2. 2. 4 光電子増倍管 ns TTS Time Transit Spread: MCP Micro Channel Plate MCP-PMT HAMAMATSU H - : ps TTS: ps MCP- PMT HAMAMATSU R U ps TTS: ps APD Avalanche Photo Diode 2.

6 図シンチレータ BaF 2 ns ZnO: Ga 15) n /n 0.5 LaBr 3 :Ce LaCl 3 :Ce LuI 3 :Ce 16),17) ns BaF 2 Z Z 光電子増倍管 ns TTS Time Transit Spread: MCP Micro Channel Plate MCP-PMT HAMAMATSU H - : ps TTS: ps MCP- PMT HAMAMATSU R U ps TTS: ps APD Avalanche Photo Diode 2. 3 陽電子を用いた寿命測定以外の測定法 PAL: Positron Annihilation Lifetime AIST Bulletin of Metrology Vol., No. September

DBPA: Doppler Broadening Positron Annihilation ACAR: Angular Correlation of Annihilation Radiation CDB: Coincidence Doppler broadening - AMOC: Age-Momentum Correlation 2.

7 DBPA: Doppler Broadening Positron Annihilation ACAR: Angular Correlation of Annihilation Radiation CDB: Coincidence Doppler broadening - AMOC: Age-Momentum Correlation ドップラー拡がり測定法 (DBPA) kev S S S / Ps p-ps o-ps o-ps Ge kev@ MeV S- W- 図二光子角相関法 (ACAR) mrad ACAR 図 14 図低速陽電子ビーム RI E max kev µm W W ev Vol., No.

ev 表 1 V ml 2 /et 2 E 0 L E 0 19),20) 21) 2. 3.

3. 5 寿命 - エネルギー相関法 (AMOC) Ge NaI:Tl 図 15 図 17

8 ev 表 1 V ml 2 /et 2 E 0 L E 0 19),20) 21) 同時計数ドップラー拡がり測定法 (CDB) Ge Ge 22 Na MeV 図寿命 - エネルギー相関法 (AMOC) Ge NaI:Tl 図 15 図 17 AMOC AIST Bulletin of Metrology Vol., No. September

DSO: Digital Storage Oscilloscope AMOC AMOC 25) 2. 3. 6 その他の陽電子利用測定法 PET Positron Emission Tomography PET PET PET 18 F 18 O p n 18 F PET PET 3.

9 DSO: Digital Storage Oscilloscope AMOC AMOC 25) その他の陽電子利用測定法 PET Positron Emission Tomography PET PET PET 18 F 18 O p n 18 F PET PET 3. 陽電子寿命標準物質の開発 26) o-ps ns o-ps 図 18 NMIJ CRM -a NMIJ: National Metrology Institute of Japan 3. 1 標準物質開発の流れ ps Si: ps Al: ps Ni: ps Fe: ps ps Vol., No.

10 Si 3. 2 陽電子消滅分光法標準物質開発の展開 NMIJ 4. 陽電子寿命測定による空孔分析に関する課題と考察 4. 1 東洋精鋼株式会社ショットピーニングの硬さ評価への応用 mm 図 19 X 29) 図 20 AIST Bulletin of Metrology Vol., No. September

4. 1. 2 ドップラー拡がり法と寿命測定法の比較 S S ps ps ps 4. 1. 3 現場での応用への課題

11 ドップラー拡がり法と寿命測定法の比較 S S ps ps ps 現場での応用への課題図 22 MBq 22 Na Mcounts S S Mcounts S 図 21 図 23 S Vol., No.

12 アンチコインシデンスシステムの提案 30) 31) 4. 2 株式会社東レリサーチセンター TRC RO nm RO RO 図 24 図材料分析のトピック SiC Si Ron / / SiC SiC AIST Bulletin of Metrology Vol., No. September

13 図 26 SiC 陽電子寿命測定用汎用型密封線源の開発 22 Na MBq RI 22 Na 表陽電子寿命測定の産業応用 HIT - RI 図時間分解能と寿命推定精度の関係 5. おわりに Vol., No.

14 m s ns nm 謝辞参考文献 P. A. M. Dirac, Proc. Camb. Phil. Soc., ( ) Positron Annihilation in Porous Silicon, Y. ITOH, H. MURAKAMI and A. KINOSHITA, ppl. Phys. Lett., ( ), ( ) Corralation of Void Size and Positron Annihilation Characteristics in Neutron-Irradiated Molybdenum, R.M.J.Cotterill, I.K.MacKenzie, L.Smedskjaer, G.Trumpy, and J.H.O.L.Traff, Nature, Vol., Pub. Date / /, p. - ( ) Positron-Annihilation Studies of Voids in Neutron- Irradiated Aluminum Single Crystals,.Triftshauser, J.D.McGervey, and R.W.Hendricks, Physical Review, Vol., p. - ( ) M. Lambrecht, A. Almazouzi, Journal of Nuclear Materials,, - ( ) J. Kwon etc., Nuclear Instruments and Methods in Physics Research, B, - ( ) S. Berko, S. Cushner, J. C. Erskine, Physics Letters A, Volume 27, Issue 10, 7 October 1968, Pages I.Ja. Dekhtjar, To the effect of dislocations on positron annihilation in metals Physics Letters A, Volume 31, Issue 10, 18 May 1970, Pages M. J. Puska and R. M. Nieminen, J. Phys. F,, ( ). ( ) K. Ito, H. Nakanishi, Y. Ujihira, JPC B,, ( ). J. V. Olsen, P. Kirkengaard, N. J. Pedersen, M. Eldrup, Phys. Stat. Sol. C,,. Saito H, Nagashima Y, Kurihara T, et al. A new positron lifetime spectrometer using a fast digital oscilloscope and BaF 2 Scintillators Nucl. Instrul. Methods Phys. Res., Sect. A, ( ) E.D. Bourret-Courchesne, S.E. Derenzo, M.J. Weber Development of ZnO:Ga as an ultra-fast scintillator Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 601, Issue 3, 1 April 2009, Pages M.D. Birowosuto, P. Dorenbos, J.T.M. de Haas, C.W.E. van Eijk, K.W. Krämer, H.U. Güdel Optical spectroscopy and luminescence quenching of LuI 3 :Ce 3+ Journal of Luminescence, Volume 118, Issue 2, June 2006, Pages J. Glodo, K.S. Shah, M. Klugerman, P. Wong, B. Higgins, P. Dorenbos Scintillation properties of LuI 3 :Ce Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 537, Issues 1-2, 21 January 2005, Pages RadioisotopesS- S AIST Bulletin of Metrology Vol., No. September

15 TETSUO YAMAZAKI, RYOICHI SUZUKI, TOSHI- YUKI OHDAIRA, TOMOHISA MIKADO, YOSHINORI KOBAYASHI, PRODUCTION AND APPLICATION OF PULSED SLOW POSITRON BEAM USING AN ELECTRON LINAC, Radiat. Phys. Chem. Vol., No., pp. -. Ryoichi Suzuki, Yoshinori Kobayashi, Koichi Awazu, Tomohisa Mikado, Mitsukuni Chiwaki, Hideaki Ohgaki and Tetsuo Yamazaki, Positron lifetime study on ion-implanted amorphous SiO 2 with a variable-energy pulsed positron beam, Nuclear Instruments and Methods in Physics Research B ( ) - Nagayasu Oshima, Ryoichi Suzuki, Toshiyuki Ohdaira, Atsushi Kinomura, Takamitsu Narumi, Akira Uedono, Masanori Fujinami, A positron annihilation lifetime measurement system with an intense positron microbeam, Radiation Physics and Chemistr y ( ) - Role of Vacancy-Solute Complex in the Initial Rapid Age Hardening in an Al-Cu-Mg Alloy, Y. Nagai, M. Murayama, Z. Tang, T. Nonaka, K. Hono, M. Hasegawa, Acta Mater., - ( ) Irradiation-induced Cu aggregations in Fe: An Origin of Embrittlement of Reactor Pressure Vessel Steels, Y. Nagai, Z. Tang, M. Hasegawa, T. Kanai, M. Saneyasu, Phys. Rev. B., - ( ) AMOC KURRI KR pp- Ito Kenji, Oka Toshitaka, Kobayashi Yoshinori, Shirai Yasuharu,,Wada Kenichiro, Matsumoto Masataka, Fujinami Masanori, Hirade Tetsuya, Honda Yoshihide, Hosomi Hiroyuki, Nagai Yasuyoshi, Inoue Koji, Saito Haruo, Sakaki Koji, Sato Kiminori, Shimazu Akira, Uedono Akira, Interlaboratory comparison of positron annihilation lifetime measurements for synthetic fused silica and polycarbonate Journal of Applied Physics,, ( ) html R. Zaleski etc., ACTA PHYSICA POLONICA A Vol., No., - ( ).. Masato Yamawaki, Yoshinori Kobayashi, Kanehisa Hattori, Yoshihiro Watanabe, Novel System for Potential Nondestructive Material Inspection using Positron Annihilation Lifetime Spectroscopy Japanese Journal of Applied Physics,, No., in press The TRC News No.(Apr. ) 22 Na RADIOISOTOPES - Vol., No.

陽電子科学第4号 (2015) 3-8

陽電子科学第4号 (2015) 3-8 4 (2015) 3 8 Japanese Positron Science Society Positron annihilation age momentum correlation (AMOC) measurement Abstract: Positron annihilation Age-MOmentum Correlation (AMOC) measurement is the coincidence

22 Na 22 Na + 22 Ne 2. 陽電子寿命測定 (PAL) の技術的背景 図 2 Na 2. 1 陽電子寿命測定法の原理 2) 3)-6) X 7) 8) 図 陽電子寿命 ( 陽電子自由消滅 ) N I I -dn/dt N /NdN - dt lnn - t C

22 Na 22 Na + 22 Ne 2. 陽電子寿命測定 (PAL) の技術的背景図 2 Na 2. 1 陽電子寿命測定法の原理 2) 3)-6) X 7) 8) 図陽電子寿命 ( 陽電子自由消滅 ) N I I -dn/dt N /NdN - dt lnn - t C